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Diode IFSM
2019-03-26 09:30:00
Forward non-repetitive surge current is usually measured with a single sinusoidal half-wave of 8.3ms, which impacts 1-4 times.
Now it's common to do it once. There used to be a standard to do it four times.
It is mainly used to evaluate the forward overcurrent capability of the diode. If it fails, the chip will be burned through by the overcurrent, and there are obvious ablation marks on the surface.
It belongs to a project of reliability test, and normal test does not need to be done.
Most people think that the test is harmful to the diode, and now others say that there is no damage. For ordinary rectifier diodes, the nominal value is usually selected in production.
1A diodes are generally between 25A and 30A.
Now it's common to do it once. There used to be a standard to do it four times.
It is mainly used to evaluate the forward overcurrent capability of the diode. If it fails, the chip will be burned through by the overcurrent, and there are obvious ablation marks on the surface.
It belongs to a project of reliability test, and normal test does not need to be done.
Most people think that the test is harmful to the diode, and now others say that there is no damage. For ordinary rectifier diodes, the nominal value is usually selected in production.
1A diodes are generally between 25A and 30A.